Nikon's NEXIV Revolutionizes Semiconductor Production with Precise Dimensional Control
Nikon's NEXIV video measurement systems have been making waves in semiconductor production, offering precise dimensional control and automated quality assurance. These advanced systems can accurately measure overlay marks of diverse shapes and heights, ensuring consistency and reliability in production processes.
NEXIV systems provide high-resolution images, enabling precise dimensional measurements. They are versatile, available in various stage sizes and with adjustable optical heads to cater to different customer needs. For instance, they can control Critical Dimension (CD) measurements of various structure types and sizes across the whole wafer, making them ideal for semiconductor production.
In addition to wafer control, NEXIV can inspect wafer IDs, including character height, width, spacing, and position relative to the wafer center. It can also measure probe card tips' position, height, and diameter for regular control. Moreover, NEXIV software can calculate necessary sizes and forms for CD measurements, going beyond simple point-to-point measurements. It can even measure bumps' height, diameter, and x/y position on the chip, demonstrating its comprehensive capabilities.
Nikon's NEXIV video measurement systems, with their high-resolution imaging, precise dimensional measurement, and automated quality control, are a boon to semiconductor production. Their versatility, with different stage sizes and adjustable optical heads, ensures they meet diverse customer demands. Coupled with Nikon's automated wafer-handling solutions like the NWL 200 wafer loader, NEXIV systems provide a comprehensive solution for controlling the dimensions of semiconductor production processes.
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